C8051F410-GQR

Key features

• ±1 LSB INL; no missing codes
• Programmable throughput up to 200 ksps
• Up to 24 external inputs
• Data dependent windowed interrupt generator
• Built-in temperature sensor (±3 °C)
• Two 12-Bit Current Mode DACs
• Two Comparators Programmable hysteresis and response time
• Configurable as wake-up or reset source
• POR/Brownout Detector
• Voltage Reference—1.5, 2.2 (programmable)
• On-chip debug circuitry facilitates full-speed, nonintrusive in-system debug (No emulator required)
• Provides breakpoints, single stepping
• Inspect/modify memory and registers
• Complete development kit
• Pipelined instruction architecture; executes 70% of instructions in 1 or 2 system clocks
• Up to 50 MIPS throughput with 50 MHz system clock
• Expanded interrupt handler
• 2304 bytes internal data RAM (256 + 2048)
• 32/16 kB Flash; In-system programmable in 512 byte sectors
• 64 bytes battery-backed RAM (smaRTClock)
• 24 port I/O; push-pull or open-drain, up to 5.25 V tolerance
• Hardware SMBus (I²C Compatible), SPI, and UART serial ports available concurrently
• Four general purpose 16-bit counter/timers
• Programmable 16-bit counter/timer array with six capture/compare modules, WDT
• Hardware smaRTClock operates down to with 64 bytes battery-backed RAM and backup voltage regulator
• Internal oscillators: 24.5 MHz 2% accuracy supports UART operation; clock multiplier up to 50 MHz
• External oscillator: Crystal, RC, C, or Clock (1 or 2 pin modes)
• smaRTClock oscillator: 32 kHz Crystal or self-resonant oscillator
• Can switch between clock sources on-the-fly